High-Resolution Transmission Electron Microscope

 

JEOL JEM-2011-HR 
 

 PFG-sc.jpg

 

  • Transmission Electron Microscopy (BF, DF, HRTEM)
  • Electron Diffraction (SAED, CBED, nanodiffraction)
  • Energy-Dispersive X-ray Spectroscopy (EDXS)
  • Oxford Instruments INCA Suite v.4.02, detection from Be on
  • Thermionic emitter (LaB6 crystal)
  • Acceleration voltage: 200 kV
  • Point-resolution: ≤0.23 nm (Cs= 1.0 mm)
  • Lattice resolution in HRTEM: ≤0.14 nm

 

  

 » Download all informations in one PDF-File

 

Contact:
Dr. Andreas Delimitis
Analytical Services Unit (ASU), Chemical Process & Energy Resources Institute (CPERI)
Centre for Research & Technology – Hellas (CERTH)

Charilaou - Thermi road
57001 Thermi, Thessaloniki
Greece
Tel: +30 / 2310 / 498259
Fax: +30 / 2310 / 498131
andel@cperi.certh.gr
http://www.cperi.certh.gr