Field-Emission Transmission Electron Microscope

JEOL JEM-2100F-UHR

 JEM2100F-EN

  • Transmission Electron Microscopy (BF, DF, HRTEM)
  • Scanning Transmission Electron Microscopy (STEM with BF, HAADF)
  • Electron Diffraction (SAED, CBED, also energy-filtered)
  • Energy-Filtered Transmission Electron Microscopy (EFTEM)
  • Electron Energy Loss Spectroscopy (EELS, ELNES), Gatan Imaging Filter, GIF 2001, with 1k-CCD Camera
  • Energy-Dispersive X-ray Spectroscopy (EDXS), Oxford Instruments INCA 200, detection from Be on

 

  • Schottky field-emitter(ZrO/W(100))
  • Acceleration voltage: 200 kV (160 kV)
  • Point-resolution: ≤0.19 nm (Cs= 0.5 mm)
  • Lattice resolution in STEM: ≤0.2 nm
  • Energy resolution in EELS: ≤0.7 eV
     

 

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Contact:
Dr. Armin Feldhoff
Institut für Physikalische Chemie und Elektrochemie
Leibniz-Universität Hannover

Callinstraße 3-3 A
30167 Hannover
Germany
Tel: +49 / 511 / 762-2940
Fax: +49 / 511 / 762-19121
armin.feldhoff@pci.uni-hannover.de
http://www.pci.uni-hannover.de